Spektra Device Testing

Device Testing

MEMS sensors for accelerationmagnetic field or pressure require an efficient and cost-optimized system level testing approach to verify the correct measurement values and calibration of a sensor device.

The S-TEST Lab product line from SPEKTRA represents a system level test solution for sensor lab and development environments. The compact hardware allows to verify product functionality already during early development stages. With its configurable digital interfaces, S-TEST solutions also provide the flexibility to test different types of sensors with minimal extra effort.

System tests that have been developed in laboratories can be easily reused and adapted for multi-parallel end-of-line testing in mass production. The related S-TEST Fab systems have been tailored for parallel testing of a large number of devices and allow an easy scalability while maintaining an optimized test per device cost ratio. Combined with the modular S-TEST software SPEKTRA offers test developers a framework which supports fast test adaptation and test time optimization, as well as integration with different exciter systems. In this combination S-TEST systems represent the complete solution for efficient system level testing during sensor development and production.

S-TEST LAB

S-TEST Lab solutions have been tailored for system level testing in development and lab environments.

S-TEST FAB

S-TEST Fab solutions offer manufacturers a flexible platform to develop end-of-line system level tests.

Stimuli

SPEKTRA exciter systems cover a wide spectrum of physical stimuli, to enable stimulated testing and calibration of a large variety of different sensors.

Software

We give product and test developers a flexible software framework at hand that enables fast development as well as adaptation of sensor system level tests.